Frustrated double ionization of argon atoms in strong laser fields
We report coincidence measurements of frustrated double ionization of argon atoms with a reaction microscope. Experimental results show electron trap- ping process during double ionization has a clear transition from the nonsequential to the sequential regime.
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2019-01-01
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| Series: | EPJ Web of Conferences |
| Online Access: | https://www.epj-conferences.org/articles/epjconf/pdf/2019/10/epjconf_up2019_06007.pdf |