Countermeasures against NBTI degradation on 6T-SRAM cells
In current process technologies, NBTI (negative bias temperature instability) has the most severe aging effect on static random access memory (SRAM) cells. This degradation effect causes loss of stability. In this paper countermeasures against this hazard are presented and quantified via simulations...
| Main Authors: | , , |
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| Format: | Article |
| Language: | deu |
| Published: |
Copernicus Publications
2011-08-01
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| Series: | Advances in Radio Science |
| Online Access: | http://www.adv-radio-sci.net/9/255/2011/ars-9-255-2011.pdf |