Application of Electrochemical Atomic Force Microscopy (EC-AFM) in the Corrosion Study of Metallic Materials
Electrochemical atomic force microscopy (EC-AFM), a branch of a scanning probe microscopy (SPM), can image substrate topography with high resolution. Since its inception, it was extended to a wide range of research areas through continuous improvement. The presence of an electrolytic cell and a pote...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-02-01
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| Series: | Materials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1944/13/3/668 |