Strong Photoluminescence Enhancement of Silicon Oxycarbide through Defect Engineering

Strong Photoluminescence Enhancement of Silicon Oxycarbide through Defect Engineering

The following study focuses on the photoluminescence (PL) enhancement of chemically synthesized silicon oxycarbide (SiCxOy) thin films and nanowires through defect engineering via post-deposition passivation treatments. SiCxOy materials were deposited via thermal chemical vapor deposition (TCVD), an...

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Bibliographic Details
Main Authors: Brian Ford, Natasha Tabassum, Vasileios Nikas, Spyros Gallis
Format: Article
Language:English
Published: MDPI AG 2017-04-01
Series:Materials
Subjects:
luminescent materials
nanowires
luminescence
spectroscopy
characterization
advanced techniques
Online Access:http://www.mdpi.com/1996-1944/10/4/446

Internet

http://www.mdpi.com/1996-1944/10/4/446

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