In-Situ Ellipsometric Study of the Optical Properties of LTL-Doped Thin Film Sensors for Copper(II) Ion Detection

In-Situ Ellipsometric Study of the Optical Properties of LTL-Doped Thin Film Sensors for Copper(II) Ion Detection

Optical sensors fabricated in zeolite nanoparticle composite films rely on changes in their optical properties (refractive index, <i>n</i>, and thickness, <i>d</i>) to produce a measurable response in the presence of a target analyte. Here, ellipsometry is used to characteriz...

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Bibliographic Details
Main Authors: Dervil Cody, Tsvetanka Babeva, Violeta Madjarova, Anastasia Kharchenko, Sabad-e-Gul, Svetlana Mintova, Christopher J. Barrett, Izabela Naydenova
Format: Article
Language:English
Published: MDPI AG 2020-04-01
Series:Coatings
Subjects:
optical sensors
optical materials
zeolites
ellipsometry
single wavelength ellipsometry
spectroscopic ellipsometry
Online Access:https://www.mdpi.com/2079-6412/10/4/423

Internet

https://www.mdpi.com/2079-6412/10/4/423

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