Dipole Relaxation in Semiconducting Zn<sub>2−x</sub>Mg<sub>x</sub>InV<sub>3</sub>O<sub>11</sub> Materials (Where x = 0.0, 0.4, 1.0, 1.6, and 2.0)

Dipole Relaxation in Semiconducting Zn<sub>2−x</sub>Mg<sub>x</sub>InV<sub>3</sub>O<sub>11</sub> Materials (Where x = 0.0, 0.4, 1.0, 1.6, and 2.0)

This paper reports on the electrical and broadband dielectric spectroscopy studies of Zn<sub>2−x</sub>Mg<sub>x</sub>InV<sub>3</sub>O<sub>11</sub> materials (where x = 0.0, 0.4, 1.0, 1.6, 2.0) synthesized using a solid-state reaction method. These studi...

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Bibliographic Details
Main Authors: Tadeusz Groń, Monika Bosacka, Elżbieta Filipek, Sebastian Pawlus, Andrzej Nowok, Bogdan Sawicki, Henryk Duda, Jerzy Goraus
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Materials
Subjects:
electrical properties
dielectric spectroscopy
relaxation processes
Online Access:https://www.mdpi.com/1996-1944/13/11/2425

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https://www.mdpi.com/1996-1944/13/11/2425

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