Analysis and Comprehensive Analytical Modeling of Statistical Variations in Subthreshold MOSFET's High Frequency Characteristics
In this research, the analysis of statistical variations in subthreshold MOSFET's high frequency characteristics defined in terms of gate capacitance and transition frequency, have been shown and the resulting comprehensive analytical models of such variations in terms of their variances have b...
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| Format: | Article |
| Language: | English |
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VSB-Technical University of Ostrava
2014-01-01
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| Series: | Advances in Electrical and Electronic Engineering |
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| Online Access: | http://advances.utc.sk/index.php/AEEE/article/view/909 |