Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes

Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes

III-nitride-based ultraviolet light emitting diode (UV LED) has numerous attractive applications in air and water purification, UV photolithography, and in situ activation of drugs through optical stimulus, solid state lighting, polymer curing, and laser surgery. However, the unclear failure mechani...

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Bibliographic Details
Main Authors: Banglong Liang, Zili Wang, Cheng Qian, Yi Ren, Bo Sun, Dezhen Yang, Zhou Jing, Jiajie Fan
Format: Article
Language:English
Published: MDPI AG 2019-09-01
Series:Materials
Subjects:
uv-led
step-stress accelerated tests
degradation rate
failure mechanism consistency
test strategy
Online Access:https://www.mdpi.com/1996-1944/12/19/3119

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https://www.mdpi.com/1996-1944/12/19/3119

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