Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces
The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil pro...
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doaj-1f0acd2ac14a4bfcaf0319321cbfd3fc2020-11-24T20:53:18ZengMDPI AGRemote Sensing2072-42922016-06-018645810.3390/rs8060458rs8060458Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil SurfacesMatías Ernesto Barber0Francisco Matías Grings1Jesús Álvarez-Mozos2Marcela Piscitelli3Pablo Alejandro Perna4Haydee Karszenbaum5Grupo de Teledetección Cuantitativa, Instituto de Astronomía y Física del Espacio (IAFE, CONICET-UBA), Int. Guiraldez 2700, Buenos Aires 1428, ArgentinaGrupo de Teledetección Cuantitativa, Instituto de Astronomía y Física del Espacio (IAFE, CONICET-UBA), Int. Guiraldez 2700, Buenos Aires 1428, ArgentinaDepartamento de Proyectos e Ingeniería Rural, Universidad Pública de Navarra, Campus de Arrosadía, Pamplona 31006, SpainCátedra de Conservación y Manejo de Suelos, Facultad de Agronomía, Universidad Nacional del Centro de la Pcia. de Buenos Aires (UNICEN), Gral. Pinto 399, Tandil 7000, ArgentinaGrupo de Teledetección Cuantitativa, Instituto de Astronomía y Física del Espacio (IAFE, CONICET-UBA), Int. Guiraldez 2700, Buenos Aires 1428, ArgentinaGrupo de Teledetección Cuantitativa, Instituto de Astronomía y Física del Espacio (IAFE, CONICET-UBA), Int. Guiraldez 2700, Buenos Aires 1428, ArgentinaThe spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil profiles have continuous spectral components, it is clear that roughness parameters are influenced by the sampling interval of the measurement device employed. In this work, we contributed to answer which sampling interval the profiles needed to be measured at to accurately account for the microwave response of agricultural surfaces. For this purpose, a 2-D laser profiler was built and used to measure surface soil roughness at field scale over agricultural sites in Argentina. Sampling intervals ranged from large (50 mm) to small ones (1 mm), with several intermediate values. Large- and intermediate-sampling-interval profiles were synthetically derived from nominal, 1 mm ones. With these data, the effect of sampling-interval-dependent roughness parameters on backscatter response was assessed using the theoretical backscatter model IEM2M. Simulations demonstrated that variations of roughness parameters depended on the working wavelength and was less important at L-band than at C- or X-band. In any case, an underestimation of the backscattering coefficient of about 1-4 dB was observed at larger sampling intervals. As a general rule a sampling interval of 15 mm can be recommended for L-band and 5 mm for C-band.http://www.mdpi.com/2072-4292/8/6/458surface soil roughnesslaser profilerheight standard deviationcorrelation lengthradar applicationsscattering models |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Matías Ernesto Barber Francisco Matías Grings Jesús Álvarez-Mozos Marcela Piscitelli Pablo Alejandro Perna Haydee Karszenbaum |
spellingShingle |
Matías Ernesto Barber Francisco Matías Grings Jesús Álvarez-Mozos Marcela Piscitelli Pablo Alejandro Perna Haydee Karszenbaum Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces Remote Sensing surface soil roughness laser profiler height standard deviation correlation length radar applications scattering models |
author_facet |
Matías Ernesto Barber Francisco Matías Grings Jesús Álvarez-Mozos Marcela Piscitelli Pablo Alejandro Perna Haydee Karszenbaum |
author_sort |
Matías Ernesto Barber |
title |
Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces |
title_short |
Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces |
title_full |
Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces |
title_fullStr |
Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces |
title_full_unstemmed |
Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces |
title_sort |
effects of spatial sampling interval on roughness parameters and microwave backscatter over agricultural soil surfaces |
publisher |
MDPI AG |
series |
Remote Sensing |
issn |
2072-4292 |
publishDate |
2016-06-01 |
description |
The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil profiles have continuous spectral components, it is clear that roughness parameters are influenced by the sampling interval of the measurement device employed. In this work, we contributed to answer which sampling interval the profiles needed to be measured at to accurately account for the microwave response of agricultural surfaces. For this purpose, a 2-D laser profiler was built and used to measure surface soil roughness at field scale over agricultural sites in Argentina. Sampling intervals ranged from large (50 mm) to small ones (1 mm), with several intermediate values. Large- and intermediate-sampling-interval profiles were synthetically derived from nominal, 1 mm ones. With these data, the effect of sampling-interval-dependent roughness parameters on backscatter response was assessed using the theoretical backscatter model IEM2M. Simulations demonstrated that variations of roughness parameters depended on the working wavelength and was less important at L-band than at C- or X-band. In any case, an underestimation of the backscattering coefficient of about 1-4 dB was observed at larger sampling intervals. As a general rule a sampling interval of 15 mm can be recommended for L-band and 5 mm for C-band. |
topic |
surface soil roughness laser profiler height standard deviation correlation length radar applications scattering models |
url |
http://www.mdpi.com/2072-4292/8/6/458 |
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