Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces

Effects of Spatial Sampling Interval on Roughness Parameters and Microwave Backscatter over Agricultural Soil Surfaces

The spatial sampling interval, as related to the ability to digitize a soil profile with a certain number of features per unit length, depends on the profiling technique itself. From a variety of profiling techniques, roughness parameters are estimated at different sampling intervals. Since soil pro...

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Bibliographic Details
Main Authors: Matías Ernesto Barber, Francisco Matías Grings, Jesús Álvarez-Mozos, Marcela Piscitelli, Pablo Alejandro Perna, Haydee Karszenbaum
Format: Article
Language:English
Published: MDPI AG 2016-06-01
Series:Remote Sensing
Subjects:
surface soil roughness
laser profiler
height standard deviation
correlation length
radar applications
scattering models
Online Access:http://www.mdpi.com/2072-4292/8/6/458

Internet

http://www.mdpi.com/2072-4292/8/6/458

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