A Two-Step A/D Conversion and Column Self-Calibration Technique for Low Noise CMOS Image Sensors

A Two-Step A/D Conversion and Column Self-Calibration Technique for Low Noise CMOS Image Sensors

In this paper, a 120 frames per second (fps) low noise CMOS Image Sensor (CIS) based on a Two-Step Single Slope ADC (TS SS ADC) and column self-calibration technique is proposed. The TS SS ADC is suitable for high speed video systems because its conversion speed is much faster (by more than 10 times...

Full description

Bibliographic Details
Main Authors: Jaeyoung Bae, Daeyun Kim, Seokheon Ham, Youngcheol Chae, Minkyu Song
Format: Article
Language:English
Published: MDPI AG 2014-07-01
Series:Sensors
Subjects:
CMOS Image Sensor (CIS)
Two-Step Single-Slope ADC
column self-calibration
low noise
Online Access:http://www.mdpi.com/1424-8220/14/7/11825

Internet

http://www.mdpi.com/1424-8220/14/7/11825

Similar Items