Modelling of Phase Structure and Surface Morphology Evolution during Compound Thin Film Deposition

The dependences of the surface roughness and the phase structure of compound thin films on substrate temperature and flux of incoming particles are investigated by a proposed mathematical model. The model, which describes physically deposited thin compound film growth process is based on the Cahn–Hi...

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Bibliographic Details
Main Authors: Gediminas Kairaitis, Arvaidas Galdikas
Format: Article
Language:English
Published: MDPI AG 2020-11-01
Series:Coatings
Subjects:
Online Access:https://www.mdpi.com/2079-6412/10/11/1077