Overview of software tools for modeling single event upsets in microelectronic devices
The paper presents the results of the analysis of existing simulation tools for evaluation of single event upset susceptibility of microelectronic devices with deep sub-micron feature sizes. This simulation tools are meant to replace obsolete approach to single event rate estimation based on integra...
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| Format: | Article |
| Language: | English |
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Moscow Engineering Physics Institute
2016-10-01
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| Series: | Bezopasnostʹ Informacionnyh Tehnologij |
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| Online Access: | https://bit.mephi.ru/index.php/bit/article/view/21 |