Investigation of Si Dendrites by Electron-Beam-Induced Current

Investigation of Si Dendrites by Electron-Beam-Induced Current

This paper reports on electron-beam-induced current (EBIC) characterization of special multicrystalline Si ingot by dendritic growth under high undercooling. Grain boundaries (GBs), dislocations, and their interaction with carbon related precipitates were investigated. The difference between grains...

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Bibliographic Details
Main Authors: Wei Yi, Jun Chen, Shun Ito, Koji Nakazato, Takashi Kimura, Takashi Sekiguchi, Kozo Fujiwara
Format: Article
Language:English
Published: MDPI AG 2018-08-01
Series:Crystals
Subjects:
mc-Si
dendrite
EBIC
grain boundaries
Online Access:http://www.mdpi.com/2073-4352/8/8/317

Internet

http://www.mdpi.com/2073-4352/8/8/317

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