Effect of Substrate Type on the Fractal Characteristics of AFM Images of Sputtered Aluminium Thin Films

Effect of Substrate Type on the Fractal Characteristics of AFM Images of Sputtered Aluminium Thin Films

The roughness features of aluminum thin films deposited by radio-frequency magnetron sputtering on Ti6Al4V, stainless steel, mild steel and commercially pure titanium substrates are studied via atomic force microscopy. The average roughness, interface width, skewness, kurtosis, roughness exponent, e...

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Bibliographic Details
Main Authors: Fredrick Madaraka MWEMA, Esther Titilayyo AKINLABI, Oluseyi Philip OLADIJO
Format: Article
Language:English
Published: Kaunas University of Technology 2019-11-01
Series:Medžiagotyra
Subjects:
aluminium thin film
atomic force microscope (afm)
fractal analysis
roughness
topology
Online Access:http://matsc.ktu.lt/index.php/MatSc/article/view/22769

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