X-Ray Reflectometry Study of Self-Assembled Ionic Nanolayers
The self-assembly technique has been applied for the fabrication of thin films including macrocyclic molecules. These multilayered structures, grown by sequential deposition of oppositely charged molecules, were characterised with X-ray reflectometry. The data obtained indicate regular thickness of...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2012-01-01
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| Series: | Journal of Nanomaterials |
| Online Access: | http://dx.doi.org/10.1155/2012/568326 |