Characteristics Modeling of GaN Class-AB Dual-Band PA Under Different Temperature and Humidity Conditions
As the technology scales down, besides the CAD tools and design guidelines, understanding circuit performance degradation as a consequence of transistor degradation becomes essential for designers. Due to several adverse environmental conditions, the study of performance degradation in the power amp...
Main Authors: | Shaohua Zhou, Abhishek Kumar Jha |
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Format: | Article |
Language: | English |
Published: |
IEEE
2021-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9524571/ |
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