Characteristics Modeling of GaN Class-AB Dual-Band PA Under Different Temperature and Humidity Conditions

As the technology scales down, besides the CAD tools and design guidelines, understanding circuit performance degradation as a consequence of transistor degradation becomes essential for designers. Due to several adverse environmental conditions, the study of performance degradation in the power amp...

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Bibliographic Details
Main Authors: Shaohua Zhou, Abhishek Kumar Jha
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9524571/