X-ray Fresnel diffractometry for ultralow emittance diagnostics of next generation synchrotron light sources
A novel technique using single-slit x-ray Fresnel diffraction has been developed to resolve μm-order electron beam sizes at the insertion devices (IDs) of photon beam lines. The new technique is promising for diagnostics of next-generation light sources, where a tuning of ultralow emittance at inser...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2015-04-01
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| Series: | Physical Review Special Topics. Accelerators and Beams |
| Online Access: | http://doi.org/10.1103/PhysRevSTAB.18.042802 |