Noise Modeling in Field Emission and Evaluation of the Nano-Receiver in Terms of Temperature
The field-emission phenomenon is exploited in a broad variety of applications and systems. Previous studies have reported that the current induced by field emission strongly and inherently depend on the temperature. This dependence enhances the noise in the current, which results in performance degr...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8701431/ |