High Power Self-Aligned, Trench-Implanted 4H-SiC JFETs

The process technology for the fabrication of 4H-SiC trenched-implanted-gate 4H–SiC vertical-channel JFET (TI-VJFET) has been developed. The optimized TIVJFETs have been fabricated with self-aligned nickel silicide source and gate contacts using a process sequence that greatly reduces process comple...

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Bibliographic Details
Main Authors: Vamvoukakis K., Stavrinidis A., Stefanakis D., Konstantinidis G., Kayambaki M., Zekentes K.
Format: Article
Language:English
Published: EDP Sciences 2017-01-01
Series:E3S Web of Conferences
Online Access:https://doi.org/10.1051/e3sconf/20171612001