Analysis of the Effective Refractive Index of Silicon Waveguides Through the Constructive and Destructive Interference in a Mach–Zehnder Interferometer
This paper introduces a method of measuring the delta between the effective refractive index of a silicon waveguide and a waveguide with wider dimensions through the constructive and destructive interference in a Mach-Zehnder interferometer (MZI). The method consists of a fixed effective refractive...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2011-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/6043779/ |