Silicon Photomultipliers: Dark Current and its Statistical Spread
Aim of this paper is to investigate on a statistical basis at the wafer level the relationship existing among the dark currents of the single pixel compared to the whole Silicon Photomultiplier array. This is the first time to our knowledge that such a comparison is made, crucial to pass this new te...
Main Authors: | , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
IFSA Publishing, S.L.
2012-03-01
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Series: | Sensors & Transducers |
Subjects: | |
Online Access: | http://www.sensorsportal.com/HTML/DIGEST/march_2012/SENSORDEVICES/P_SI_188.pdf |