Unprecedented grain size effect on stacking fault width

Using an atomistic-phase field dislocation dynamics model, we isolate and investigate grain size and stress effects on the stacking fault width created by partial dislocation emission from a boundary. We show that the nucleation stress for a Shockley partial is governed by size of the boundary defec...

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Bibliographic Details
Main Authors: A. Hunter, I. J. Beyerlein
Format: Article
Language:English
Published: AIP Publishing LLC 2013-09-01
Series:APL Materials
Online Access:http://link.aip.org/link/doi/10.1063/1.4820427