Similarity-Based Difference Analysis Approach for Remaining Useful Life Prediction of GaAs-Based Semiconductor Lasers
Recently, the analysis of remaining useful life (RUL), which is central to the reliability assessment of lasers under various environment stresses, has become one of the most crucial issues in the field of laser reliability. In this paper, a similarity-based difference analysis (SbDA) approach is pr...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2017-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8057752/ |