Instrument Calibration for Nanotechnology
The problem of instrument calibration for nanotechnological applications is discussed, with particular reference to the establishment of standards based upon easily reproduced natural parameters such as the lattice spacing of a homogeneous crystal. The successful application of X-ray interferometry...
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
SAGE Publishing
1991-03-01
|
| Series: | Measurement + Control |
| Online Access: | https://doi.org/10.1177/002029409102400202 |