Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX

The article presents the hardware-software complex for functional and parametric tests of ARM microcontrollers STM32F1XX. The complex is based on PXI devices by National Instruments and LabVIEW software environment. Data exchange procedure between a microcontroller under test and the complex hardwar...

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Main Authors: Egorov Aleksey, Nekrasov Pavel, Kalashnikov Oleg
Format: Article
Language:English
Published: EDP Sciences 2016-01-01
Series:MATEC Web of Conferences
Online Access:http://dx.doi.org/10.1051/matecconf/20167901031
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spelling doaj-0ae967bee1c2431c8f020f35597d75702021-02-02T00:50:22ZengEDP SciencesMATEC Web of Conferences2261-236X2016-01-01790103110.1051/matecconf/20167901031matecconf_imet2016_01031Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XXEgorov AlekseyNekrasov PavelKalashnikov OlegThe article presents the hardware-software complex for functional and parametric tests of ARM microcontrollers STM32F1XX. The complex is based on PXI devices by National Instruments and LabVIEW software environment. Data exchange procedure between a microcontroller under test and the complex hardware is describes. Some test results are also presented.http://dx.doi.org/10.1051/matecconf/20167901031
collection DOAJ
language English
format Article
sources DOAJ
author Egorov Aleksey
Nekrasov Pavel
Kalashnikov Oleg
spellingShingle Egorov Aleksey
Nekrasov Pavel
Kalashnikov Oleg
Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX
MATEC Web of Conferences
author_facet Egorov Aleksey
Nekrasov Pavel
Kalashnikov Oleg
author_sort Egorov Aleksey
title Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX
title_short Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX
title_full Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX
title_fullStr Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX
title_full_unstemmed Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX
title_sort hardware-software complex for functional and parametric tests of arm microcontrollers stm32f1xx
publisher EDP Sciences
series MATEC Web of Conferences
issn 2261-236X
publishDate 2016-01-01
description The article presents the hardware-software complex for functional and parametric tests of ARM microcontrollers STM32F1XX. The complex is based on PXI devices by National Instruments and LabVIEW software environment. Data exchange procedure between a microcontroller under test and the complex hardware is describes. Some test results are also presented.
url http://dx.doi.org/10.1051/matecconf/20167901031
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AT nekrasovpavel hardwaresoftwarecomplexforfunctionalandparametrictestsofarmmicrocontrollersstm32f1xx
AT kalashnikovoleg hardwaresoftwarecomplexforfunctionalandparametrictestsofarmmicrocontrollersstm32f1xx
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