Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX
The article presents the hardware-software complex for functional and parametric tests of ARM microcontrollers STM32F1XX. The complex is based on PXI devices by National Instruments and LabVIEW software environment. Data exchange procedure between a microcontroller under test and the complex hardwar...
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EDP Sciences
2016-01-01
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Series: | MATEC Web of Conferences |
Online Access: | http://dx.doi.org/10.1051/matecconf/20167901031 |
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doaj-0ae967bee1c2431c8f020f35597d75702021-02-02T00:50:22ZengEDP SciencesMATEC Web of Conferences2261-236X2016-01-01790103110.1051/matecconf/20167901031matecconf_imet2016_01031Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XXEgorov AlekseyNekrasov PavelKalashnikov OlegThe article presents the hardware-software complex for functional and parametric tests of ARM microcontrollers STM32F1XX. The complex is based on PXI devices by National Instruments and LabVIEW software environment. Data exchange procedure between a microcontroller under test and the complex hardware is describes. Some test results are also presented.http://dx.doi.org/10.1051/matecconf/20167901031 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Egorov Aleksey Nekrasov Pavel Kalashnikov Oleg |
spellingShingle |
Egorov Aleksey Nekrasov Pavel Kalashnikov Oleg Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX MATEC Web of Conferences |
author_facet |
Egorov Aleksey Nekrasov Pavel Kalashnikov Oleg |
author_sort |
Egorov Aleksey |
title |
Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX |
title_short |
Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX |
title_full |
Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX |
title_fullStr |
Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX |
title_full_unstemmed |
Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX |
title_sort |
hardware-software complex for functional and parametric tests of arm microcontrollers stm32f1xx |
publisher |
EDP Sciences |
series |
MATEC Web of Conferences |
issn |
2261-236X |
publishDate |
2016-01-01 |
description |
The article presents the hardware-software complex for functional and parametric tests of ARM microcontrollers STM32F1XX. The complex is based on PXI devices by National Instruments and LabVIEW software environment. Data exchange procedure between a microcontroller under test and the complex hardware is describes. Some test results are also presented. |
url |
http://dx.doi.org/10.1051/matecconf/20167901031 |
work_keys_str_mv |
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1724312785530126336 |