Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

In principle, non-contact atomic force microscopy (NC-AFM) now readily allows for the measurement of forces with sub-nanonewton precision on the atomic scale. In practice, however, the extraction of the often desired ‘short-range’ force from the experimental observable (frequency shift) is often far...

Full description

Bibliographic Details
Main Authors: Adam Sweetman, Andrew Stannard
Format: Article
Language:English
Published: Beilstein-Institut 2014-04-01
Series:Beilstein Journal of Nanotechnology
Subjects:
background subtraction
DFM
F(z)
force
atomic resolution
NC-AFM
Si(111)
STM
van der Waals
Online Access:https://doi.org/10.3762/bjnano.5.45

Internet

https://doi.org/10.3762/bjnano.5.45

Similar Items