Structural characterization of PbTi03, Sm0.6Nd0.4NiO3 and NdMnO3 multifunctional Perovskite thin films

Structural characterization of PbTi03, Sm0.6Nd0.4NiO3 and NdMnO3 multifunctional Perovskite thin films

Different multifunctional (PbTiO3, Sm0.6Nd0.4NiO3, NdMnO3) thin films were grown by metalorganic chemical vapor deposition (MOCVD) technique on SrTiO3 and LaAlO3 substrates. TEM and X-ray diffraction measurements reveal that almost single crystalline thin films can be epitaxially grown on the top of...

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Bibliographic Details
Main Authors: Rapenne L., Girardot C., Ihzaz N., Pignard S., Boudard M., Roussel H., Bartasyte A.
Format: Article
Language:English
Published: EDP Sciences 2012-06-01
Series:EPJ Web of Conferences
Subjects:
MOCVD
Thin film
Perovskites
X-ray diffraction
TEM
Online Access:http://dx.doi.org/10.1051/epjconf/20122900009

Internet

http://dx.doi.org/10.1051/epjconf/20122900009

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