Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization

• Main Authors: Ian MacLaren, Thomas A. Macgregor, Christopher S. Allen, Angus I. Kirkland
• Format: Article
• Language: English
• Published: AIP Publishing LLC 2020-11-01
• Series: APL Materials
• Online Access: http://dx.doi.org/10.1063/5.0026992

Detectors are revolutionizing possibilities in scanning transmission electron microscopy because of the advent of direct electron detectors that record at a high quantum efficiency and with a high frame rate. This allows the whole back focal plane to be captured for each pixel in a scan and the dataset to be processed to reveal whichever features are of interest. There are many possible uses for this advance of direct relevance to understanding the nano- and atomic-scale structure of materials and heterostructures. This article gives our perspective of the current state of the field and some of the directions where it is likely to go next. First, a wider overview of the recent work in this area is given before two specific examples of its application are given: one is imaging strain in thin films and the other one is imaging changes in periodicity along the beam direction as a result of the formation of an ordered structure in an epitaxial thin film. This is followed by an outlook that presents future possible directions in this rapidly expanding field.