Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization
Detectors are revolutionizing possibilities in scanning transmission electron microscopy because of the advent of direct electron detectors that record at a high quantum efficiency and with a high frame rate. This allows the whole back focal plane to be captured for each pixel in a scan and the data...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2020-11-01
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| Series: | APL Materials |
| Online Access: | http://dx.doi.org/10.1063/5.0026992 |