A New Control Chart for Monitoring Reliability Using Sudden Death Testing Under Weibull Distribution

In this paper, a new control chart using sudden death testing is designed by assuming that the lifetime/failure time of the product follows the Weibull distribution. The structure of the proposed chart is presented. The control chart coefficient is determined using some specified average run length...

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Bibliographic Details
Main Authors: Muhammad Aslam, Osama H. Arif, Chi-Hyuck Jun
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8076825/