Design and analysis of single- ended robust low power 8T SRAM cell

This paper is based on the observation of 8T single ended static random access memory (SRAM) and two techniques for reducing the sub threshold leakage current, power consumption are examined. In the first technique, effective supply voltage and ground node voltages are changed using a dynamic variab...

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Bibliographic Details
Main Authors: Gupta Neha, Pahuja Hitesh
Format: Article
Language:English
Published: EDP Sciences 2016-01-01
Series:MATEC Web of Conferences
Online Access:http://dx.doi.org/10.1051/matecconf/20165701005