The Components Spatial Redundancy Method Based on Design Space Exploration
The fault mitigation for modern embedded systems developed by thin design rules (40 nm and less) is necessary feature due to accelerating aging and manufacturing defects, for which diagnosis during the chip testing at fabric is impossible. Different ways of spatial redundancy are used for fault miti...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
FRUCT
2017-04-01
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| Series: | Proceedings of the XXth Conference of Open Innovations Association FRUCT |
| Subjects: | |
| Online Access: | https://fruct.org/publications/abstract20/files/Roz.pdf |