NI Based System for Seu Testing of Memory Chips for Avionics

NI Based System for Seu Testing of Memory Chips for Avionics

This paper presents the results of implementation of National Instrument based system for Single Event Upset testing of memory chips into neutron generator experimental facility, which used for SEU tests for avionics purposes. Basic SEU testing algorithm with error correction and constant errors det...

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Bibliographic Details
Main Authors: Boruzdina Anna, Yanenko Andrey, Tikhomirov Georgy, Tumanov Vitaly
Format: Article
Language:English
Published: EDP Sciences 2016-01-01
Series:MATEC Web of Conferences
Online Access:http://dx.doi.org/10.1051/matecconf/20167901028

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