A Stochastic Geometry Approach to EMF Exposure Modeling

A Stochastic Geometry Approach to EMF Exposure Modeling

Downlink exposure to electromagnetic fields due to cellular base stations in urban environments is studied using the stochastic geometry framework. A two-dimensional Poisson Point Process is assumed for the base station distribution. Mathematical expressions of statistics of exposure are derived fro...

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Bibliographic Details
Main Authors: Quentin Gontier, Lucas Petrillo, Francois Rottenberg, Francois Horlin, Joe Wiart, Claude Oestges, Philippe De Doncker
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Cellular networks
exposure
Poisson Point Process
stochastic geometry
Online Access:https://ieeexplore.ieee.org/document/9462948/

Internet

https://ieeexplore.ieee.org/document/9462948/

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