Compact Modeling of Distributed Effects in 2-D Vertical Tunnel FETs and Their Impact on DC and RF Performances

In this paper, distributed effects along the channel are investigated for 2-D vertical tunnel FETs by developing a model based on a succession of unit cells along the channel, each of which includes lateral FET conduction and vertical tunnel conduction components. The distributed model shows that th...

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Bibliographic Details
Main Authors: Jie Min, Peter M. Asbeck
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Subjects:
DC
RF
Online Access:https://ieeexplore.ieee.org/document/7858682/