Process Dependence of Soft Errors Induced by Alpha Particles, Heavy Ions, and High Energy Neutrons on Flip Flops in FDSOI
Soft-error tolerance depending on threshold voltage of transistors was evaluated by α -particle, heavy-ion, and neutron irradiation. Three chips were fabricated, one embeds low-threshold general-purpose (GP) transistors and the others embed high-threshold low-power (LP) transistors in a 6...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8674457/ |