Slow Degradation Fault Detection in a Harsh Environment

The ever increasing challenges posed by the science projects in astronomy have skyrocketed the complexity of the new generation telescopes. Due to the climate and sky requirements, these high-precision instruments are generally located in remote areas, suffering from the harsh environments around it...

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Bibliographic Details
Main Authors: Anthony D. Cho, Rodrigo A. Carrasco, Gonzalo A. Ruz, Jose Luis Ortiz
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9205191/