Reliability Analysis of Electrotechnical Devices

Reliability Analysis of Electrotechnical Devices

This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.

Bibliographic Details
Format: eBook
Language:English
Published: Basel MDPI - Multidisciplinary Digital Publishing Institute 2022
Subjects:
History of engineering & technology
Technology: general issues
3D X-ray
3D-IC (three-dimensional integrated circuit)
BGA
bias temperature-humidity reliability test
conductive anodic filament (CAF)
de-penalization
deconvolution
deep space environment
elastic mechanical properties
electrochemistry based electrical model
electromagnetic interference
extreme thermal shocks
factorial design of experiment
finite element analysis
fracture failure
gamma process
GaN
genetic algorithm optimization
lifetime
lineal energy
linear energy transfer
low temperature
measurement system analysis
microdosimetry
Monte Carlo simulation
multiple-input multiple-output (MIMO)
n/a
near field measurement
operational amplifier
pressureless sintered micron silver joints
prompt gamma imaging
proton therapy
quality and reliability assurance
radiation hardness
reconstruction
reliability estimation
remaining useful life
return loss
SAC305
semi-empirical capacity fading model
simulation
single event effect
single event effects
state of health
useful life distribution
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Internet

Open Access: DOAB: description of the publication
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