Research on the emitter thickness optimization of GaInP/GaAs/Ge triple-junction solar cell under space proton irradiation based on TCAD simulation

by Junwei Li, Jintao Wang, Chengying Shi, Zujun Wang, YuanYuan Xue
Published 2020-11-01

Neutron radiation effects on linear CCDs at different clock pulse frequency

by Zujun Wang, Wei Chen, Benqi Tang, Zhigang Xiao, Zhibin Yao, Baoping He, Minbo Liu
Published 2015-06-01

Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage

by Zujun Wang, Baoping He, Wuying Ma, Zhibin Yao, Shaoyan Huang, Minbo Liu, Jiangkun Sheng
Published 2016-01-01

Investigation of reactor neutron irradiation induced dark signals increase in COTS array CCDs

by Zujun Wang, Hongxia Guo, Zhang Wenshou, Tongding Luo, Shaoyan Huang, Benqi Tang, Junshan Jin
Published 2014-09-01

Combined reactor neutron beam and 60Co γ-ray radiation effects on CMOS APS image sensors

by Zujun Wang, Wei Chen, Jiangkun Sheng, Yan Liu, Zhigang Xiao, Shaoyan Huang, Minbo Liu
Published 2015-02-01

Dose rate effects on array CCDs exposed by Co-60 γ rays induce saturation output degradation and annealing tests

by Zujun Wang, Wei Chen, Baoping He, Zhibin Yao, Zhigang Xiao, Jiangkun Sheng, Minbo Liu
Published 2015-10-01

Displacement damage effects on CMOS APS image sensors induced by neutron irradiation from a nuclear reactor

by Zujun Wang, Shaoyan Huang, Minbo Liu, Zhigang Xiao, Baoping He, Zhibin Yao, Jiangkun Sheng
Published 2014-07-01

Theoretical and experimental study of the dark signal in CMOS image sensors affected by neutron radiation from a nuclear reactor

by Yuanyuan Xue, Zujun Wang, Baoping He, Zhibin Yao, Minbo Liu, Wuying Ma, Jiangkun Sheng, Guantao Dong, Junshan Jin
Published 2017-12-01

Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors

by Zujun Wang, Wuying Ma, Shaoyan Huang, Zhibin Yao, Minbo Liu, Baoping He, Jing Liu, Jiangkun Sheng, Yuan Xue
Published 2016-03-01

Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects

by Yuanyuan Xue, Zujun Wang, Wei Chen, Minbo Liu, Baoping He, Zhibin Yao, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin
Published 2017-11-01