Laser on-line Thickness Measurement Technology Based on Judgment and Wavelet De-noising

by Xu Ancheng, Xu Qingquan, Chen Gong, Zhu Xifang, Zhang Hua, Liu Xiaojun
Published 2014-04-01

The One-dimensional Property of Sr/Si(111)-3×2 Reconstructed Surface

by Du Wenhan, Yang Jingjing, Zhao Yu, Xiong Chao, Xiao Jin, Ma Jinxiang, Zhu Xifang
Published 2016-01-01