Dependence-Analysis-Based Data-Refinement in Optical Scatterometry for Fast Nanostructure Reconstruction

by Zhengqiong Dong, Xiuguo Chen, Xuanze Wang, Yating Shi, Hao Jiang, Shiyuan Liu
Published 2019-09-01

A Portable Impedance Spectroscopy Measurement Method Through Adaptive Reference Resistance

by Xuanze Wang, Hang Zhao, Aihui Wang, Zhengqiong Dong, Yiyan Fan, Zhongsheng Zhai
Published 2021-01-01