On the Relationship between Risk Neutral Density and Investors\'\' Emotion.

by Yung-Hsien Wu, 吳泳嫻
Published 2019

Toward Low-Power Flash Memory: Prospect of Adopting Crystalline Oxide as Charge Trapping Layer

by Kuen-Yi Chen, Shih-Chieh Teng, Hui-Hsin Chang, Yung-Hsien Wu
Published 2016-01-01

High Performance Metal-Gate/High-<inline-formula> <tex-math notation="LaTeX">${\kappa } $ </tex-math></inline-formula> GaN MOSFET With Good Reliability for Both Logic and Power App...

by Shih-Han Yi, Dun-Bao Ruan, Shaoyan Di, Xiaoyan Liu, Yung Hsien Wu, Albert Chin
Published 2016-01-01

High-Quality Gate Oxide for Ge Capacitor Fabricated on Si Substrate

by Jia-Rong Wu, 吳家榮
Published 2007