Reproducible strain measurement in electronic devices by applying integer multiple to scanning grating in scanning moiré fringe imaging

by Suhyun Kim, Younheum Jung, Joong Jung Kim, Sunyoung Lee, Haebum Lee, Yukihito Kondo
Published 2014-10-01

Reliable strain measurement in transistor arrays by robust scanning transmission electron microscopy

by Suhyun Kim, Joong Jung Kim, Younheum Jung, Kyungwoo Lee, Gwangsun Byun, KyoungHwan Hwang, Sunyoung Lee, Kyupil Lee
Published 2013-09-01