Linkages among commodity futures prices in the recent financial crisis: An application of cointegration tests with a structural break

by Yoichi Tsuchiya
Published 2015-12-01

Electrical characteristics of gated‐anode diodes based on normally‐off GaN HEMT structures for rectenna applications

by Hidemasa Takahashi, Yuji Ando, Yoichi Tsuchiya, Akio Wakejima, Hiroaki Hayashi, Eiji Yagyu, Koichi Kikkawa, Naoki Sakai, Kenji Itoh, Jun Suda
Published 2021-10-01