Soft x-ray emission spectroscopy studies of the electronic structure of silicon supersaturated with sulfur

by Winkler, Mark Thomas, Newman, Bonna Kay, Buonassisi, Tonio, Wilks, R. G., Weinhardt, L., Recht, D., Said, A. J., Zhang, Y., Blum, M., Krause, S., Yang, W. L., Heske, C., Aziz, Michael J., Bar, M., Sullivan, Joseph Timothy, Ph. D. Massachusetts Institute of Technology
Published 2013