Long-term transient radiation effects in high-speed signal switches implemented in 0.1 um E/D pHEMT process

by Kuznetsov Aleksander, Elesin Vadim, Usachev Nikolay, Chukov George
Published 2019-01-01

Measurement Issues of Radio Frequency Integrated Circuits with Digital Control at Radiation Testing

by Amburkin Konstantin, Chukov George, Elesin Vadim, Nazarova Galina, Usachev Nikolay
Published 2016-01-01

The design and testing issues of radiation tolerant microwave amplifiers implemented in the domestic GaAs pHEMT 0.5 μm process

by Sotskov Denis, Kuznetsov Alexander, Usachev Nikolay, Elesin Vadim, Selishchev Ilya
Published 2019-01-01