Electrical characterization of RuOx/n-GaN Schottky diodes formed by oxidizing ruthenium thin-films in normal laboratory air

by Noah Allen, Timothy Ciarkowski, Eric Carlson, Amrita Chakraborty, Louis Guido
Published 2020-01-01

Connection between Carbon Incorporation and Growth Rate for GaN Epitaxial Layers Prepared by OMVPE

by Timothy Ciarkowski, Noah Allen, Eric Carlson, Robert McCarthy, Chris Youtsey, Jingshan Wang, Patrick Fay, Jinqiao Xie, Louis Guido
Published 2019-08-01