Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision

by Wen-Hao Su, Jiajing Zhang, Ce Yang, Rae Page, Tamas Szinyei, Cory D. Hirsch, Brian J. Steffenson
Published 2021-12-01

Genetic architecture of agronomic and quality traits in a nested association mapping population of spring wheat

by Ahmad H. Sallam, Fazal Manan, Prabin Bajgain, Matthew Martin, Tamas Szinyei, Emily Conley, Gina Brown‐Guedira, Gary J. Muehlbauer, James A. Anderson, Brian J. Steffenson
Published 2020-11-01